- Product Model SN74LVTH18646APMG4
- Brand Texas Instruments
- RoHS Yes
- Description IC SCAN-TEST-DEV/XCVR 64-LQFP
- Classification Specialty Logic
Inventory:2183
Technical Details
- Package / Case 64-LQFP
- Mounting Type Surface Mount
- Number of Bits 18
- Logic Type ABT Scan Test Device With Transceivers and Registers
- Operating Temperature -40°C ~ 85°C
- Supply Voltage 2.7V ~ 3.6V
- Supplier Device Package 64-LQFP (10x10)
Related Products
IC SCAN-TEST-DEV/XCVR 64-LQFP
Inventory: 305
