- 产品型号 SN74ABT8245DWR
- 品牌 Texas Instruments
- RoHS Yes
- 描述 IC SCAN TEST DEV W/OBT 24-SOIC
- 分类 专业逻辑
-
PDF
- 库存 1500
定价:
- 2000 3.72
技术参数
- Package / Case 24-SOIC (0.295", 7.50mm Width)
- Mounting Type Surface Mount
- Number of Bits 8
- Logic Type Scan Test Device with Bus Transceivers
- Operating Temperature -40°C ~ 85°C
- Supply Voltage 4.5V ~ 5.5V
- Supplier Device Package 24-SOIC
- ECCN EAR99
- HTSUS 8542.39.0001
- Moisture Sensitivity Level (MSL) 1 (Unlimited)
- REACH Status REACH Unaffected
- RoHS Status ROHS3 Compliant
相关产品
IC SCAN TEST DEV/TXRX 24-SOIC
库存: 1538
- 1: 5.75
- 10: 5.2
- 25: 4.95
- 100: 4.3
- 250: 4.26
