- Product Model SN74BCT8374ADWR
- Brand Texas Instruments
- RoHS Yes
- Description IC SCAN TEST DEVICE W/FF 24-SOIC
- Classification Specialty Logic
Inventory:1500
Technical Details
- Package / Case 24-SOIC (0.295", 7.50mm Width)
- Mounting Type Surface Mount
- Number of Bits 8
- Logic Type Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Operating Temperature 0°C ~ 70°C
- Supply Voltage 4.5V ~ 5.5V
- Supplier Device Package 24-SOIC
Related Products
IC SCAN TEST DEVICE W/FF 24-SOIC
Inventory: 75
